Lorlin® manufactures high performance discrete semiconductor test systems offering the highest quality standards, test capability, ease of use, and flexibility at reasonable prices with both new and factory reconditioned testers available. The semiconductor component testers are designed to accurately verify and check the critical parameters of small signal and power semiconductor devices. The library of parametric tests include breakdown voltages, leakage currents, gain, saturation voltages, RDSon, GFS, on-state, off-state, dynamic capacitance among many others. The devices tested can be in a single, array, or hybrid, such as TO-3, TO-220, SOT-23, TO-18/92, DO4/7, SOIC, SMD and virtually any other standard or custom part package. The high reliability automated semiconductor testers, can be used in all manual and automatic testing applications for IGBTs, FETs, Transistors, Darlington's, Diodes, GaN, Mosfets, JFETs, Power FETs, Zeners, Rectifiers, Bridges, IGBT Modules, SCRs, Triacs, Hybrids and Opto-Coupled Devices, ensuring reliable, accurate, and repeatable results. The Lorlin® testers include the most powerful testing software in the industry and operate under a Windows 10® 64-BIT OS with a USB 2.0 tester communications interface for the highest performance, speed and accuracy. Lorlin is eager to work with customers on their test requirements including customization.