Test Acuity Solutions (previously Test Advantage Software) develops, and deploys leading-edge, proprietary software to automate manufacturing quality and facilitate equipment utilization and process improvements throughout the semiconductor back-end manufacturing process. Our solutions have repeatedly proven that no trade off is automatically necessary between device quality and the cost of test. Technology attributes: • Die grading and die disposition technology based on performance variability analysis of Wafer Fab and Test Data • Wafer level disposition technology based on regional spatial and automatic pattern detection analysis • End-to-end connectivity using open-standards enabling Adaptive Test and Adaptive feed-forward, Single Device Traceability (SDT) and Intelligent Recall through the Kinesys Test Advantage technology partnership. • Corporate-wide test quality and efficiency standards throughout the semiconductor product lifecycle Test Advantage Software patented and patent pending proprietary technologies exposes device marginality and enables next generation, feed-forward, adaptive test strategies, addressing the timely concern across the semiconductor industry as companies battle cost of test. Our solutions provide the technology to enable downstream process flow decisions in order to optimize production strategy and cost.This is beco